DEVICE FOR GENERATING AND DETECTING MAGNETIC MATERIAL STRUCTURES AT ATOMIC LEVELS

摘要

In a device with a tunnel microscope system for scanning a material surface with a sensor at atomic levels, the sensor (2) has a magnetically effective sensing point (3) for generating and detecting magnetic structures on the material surface. Controllable moving and positioning means (5-10) are also provided for bringing the material surface (1) close to the sensing point (3) and the sensing point (3) close to a tunnel end (4) by a nanometric distance. Measurement signals for the relative deviation of the sensing point (3) with respect to the material surface (1) during scanning are supplied to a computer (40), where the measurement values are affected to corresponding sensing positions. The magnetic sensing point (3) can be made of a permanent magnet or of an electromagnetic induction element. Magnetic structures at atomic levels can thus be produced and located in a reproducible manner.