Method to test groups of electronic structural elements; involves using response output signal following input of test signal in integrated circuit to be tested with common test signal entered in electronic structural elements of group

摘要

A group of electronic structural elements (A1,A2) to be tested are evaluated as good or defective, based on a response signal of the structural element in its totality as good or defective. In a second test, each test object (A1,A2) of the group that is designated defective is supplied with an independent test signal, and is declared to be good or defective depending on the response signal of this structural element. An Independent claim is included for a device for implementing the method.