发明名称 |
LITHOGRAPHIC APPARATUS, PROGRAMMABLE PATTERNING DEVICE AND LITHOGRAPHIC METHOD |
摘要 |
A lithographic apparatus and programmable patterning device is disclosed that includes a modulator configured to expose an exposure area of the substrate to a plurality of beams modulated according to a desired pattern and a projection system configured to project the modulated beams onto the substrate. The modulator includes a plurality of VECSELs or VCSELs. The projection system may include a zone plate array that is oscillated in a Lissajous pattern. The zone plate array may include lenses arranged in a two-dimensional array where the lenses are arranged in a triangular layout. A lithographic system may include a plurality of the lithographic apparatuses, at least one lithographic apparatus being arranged above another lithographic apparatus. |
申请公布号 |
US2016195822(A1) |
申请公布日期 |
2016.07.07 |
申请号 |
US201414911929 |
申请日期 |
2014.07.11 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
VAN DE KERKHOF Franciscus Johannes |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
1. A lithographic apparatus comprising:
a substrate holder constructed to hold a substrate; a modulator configured to expose an exposure area of the substrate to a plurality of beams modulated according to a desired pattern, the modulator comprising a plurality of VECSELs or VCSELs to provide the plurality of beams; and a projection system configured to project the modulated beams onto the substrate. |
地址 |
Veldhoven NL |