发明名称 LITHOGRAPHIC APPARATUS, PROGRAMMABLE PATTERNING DEVICE AND LITHOGRAPHIC METHOD
摘要 A lithographic apparatus and programmable patterning device is disclosed that includes a modulator configured to expose an exposure area of the substrate to a plurality of beams modulated according to a desired pattern and a projection system configured to project the modulated beams onto the substrate. The modulator includes a plurality of VECSELs or VCSELs. The projection system may include a zone plate array that is oscillated in a Lissajous pattern. The zone plate array may include lenses arranged in a two-dimensional array where the lenses are arranged in a triangular layout. A lithographic system may include a plurality of the lithographic apparatuses, at least one lithographic apparatus being arranged above another lithographic apparatus.
申请公布号 US2016195822(A1) 申请公布日期 2016.07.07
申请号 US201414911929 申请日期 2014.07.11
申请人 ASML NETHERLANDS B.V. 发明人 VAN DE KERKHOF Franciscus Johannes
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A lithographic apparatus comprising: a substrate holder constructed to hold a substrate; a modulator configured to expose an exposure area of the substrate to a plurality of beams modulated according to a desired pattern, the modulator comprising a plurality of VECSELs or VCSELs to provide the plurality of beams; and a projection system configured to project the modulated beams onto the substrate.
地址 Veldhoven NL