发明名称 Salt, photoresist composition and method for producing photoresist pattern
摘要 A salt represented by formula (I):; wherein Q1 and Q2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group, A1 represents a C1-C30 monovalent organic group,X1 represents a C1-C10 aliphatic hydrocarbon group where a hydrogen atom may be replaced by a hydroxy group,m1 and m2 independently each represent an integer of 1 to 4, andZ+ represents an organic cation.
申请公布号 US9428485(B2) 申请公布日期 2016.08.30
申请号 US201213491370 申请日期 2012.06.07
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 Masuyama Tatsuro;Mukai Yuichi
分类号 G03F7/028;C07D321/10;C07C309/10;C07C309/12;C07C381/12;G03F7/004;G03F7/039;G03F7/11;G03F7/20 主分类号 G03F7/028
代理机构 Birch, Stewart, Kolasch & Birch, LLP 代理人 Birch, Stewart, Kolasch & Birch, LLP
主权项 1. A photoresist composition, which comprises a salt represented by formula (I): wherein Q1 and Q2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group, A1 represents a C3-C30 alicyclic hydrocarbon group in which a hydrogen atom may be replaced by a hydroxy group or a halogen group and in which a methylene group may be replaced by an oxygen atom, a sulfonyl group or a carbonyl group, X1 represents a C1-C10 aliphatic hydrocarbon group where a hydrogen atom may be replaced by a hydroxy group, m1 and m2 independently each represent an integer of 1 to 4, and Z+ represents an organic cation, a resin which is hardly soluble or insoluble but soluble in an aqueous alkali solution by action of an acid, and a resin having a structural unit represented by formula (FI): wherein RF1 represents a hydrogen atom or a methyl group, AF1 represents a C1-C6 alkanediyl group, and RF2 represents a C1-C10 hydrocarbon group having a fluorine atom.
地址 Tokyo JP