发明名称 |
SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME |
摘要 |
A semiconductor device structure is provided. The semiconductor device structure includes a semiconductor substrate. The semiconductor device structure includes a first gate stack over the semiconductor substrate. The semiconductor device structure includes a second gate stack over the semiconductor substrate. The semiconductor device structure includes an erase gate between the first gate stack and the second gate stack. The erase gate has a recess recessed toward the semiconductor substrate. The semiconductor device structure includes a first word line adjacent to the first gate stack. The semiconductor device structure includes a second word line adjacent to the second gate stack. |
申请公布号 |
US2016163876(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201414560353 |
申请日期 |
2014.12.04 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd |
发明人 |
WU Chang-Ming;HUANG Wei-Hang;LIU Shih-Chang |
分类号 |
H01L29/788;H01L29/66 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device structure, comprising:
a semiconductor substrate; a first gate stack over the semiconductor substrate; a second gate stack over the semiconductor substrate; an erase gate between the first gate stack and the second gate stack, wherein the erase gate has a recess recessed toward the semiconductor substrate; a first word line adjacent to the first gate stack; a second word line adjacent to the second gate stack; a first spacer over a top surface of the erase gate; and a second spacer over the top surface of the erase gate, wherein the first spacer and the second spacer are separated from each other. |
地址 |
Hsin-Chu TW |