发明名称 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME
摘要 A semiconductor device structure is provided. The semiconductor device structure includes a semiconductor substrate. The semiconductor device structure includes a first gate stack over the semiconductor substrate. The semiconductor device structure includes a second gate stack over the semiconductor substrate. The semiconductor device structure includes an erase gate between the first gate stack and the second gate stack. The erase gate has a recess recessed toward the semiconductor substrate. The semiconductor device structure includes a first word line adjacent to the first gate stack. The semiconductor device structure includes a second word line adjacent to the second gate stack.
申请公布号 US2016163876(A1) 申请公布日期 2016.06.09
申请号 US201414560353 申请日期 2014.12.04
申请人 Taiwan Semiconductor Manufacturing Co., Ltd 发明人 WU Chang-Ming;HUANG Wei-Hang;LIU Shih-Chang
分类号 H01L29/788;H01L29/66 主分类号 H01L29/788
代理机构 代理人
主权项 1. A semiconductor device structure, comprising: a semiconductor substrate; a first gate stack over the semiconductor substrate; a second gate stack over the semiconductor substrate; an erase gate between the first gate stack and the second gate stack, wherein the erase gate has a recess recessed toward the semiconductor substrate; a first word line adjacent to the first gate stack; a second word line adjacent to the second gate stack; a first spacer over a top surface of the erase gate; and a second spacer over the top surface of the erase gate, wherein the first spacer and the second spacer are separated from each other.
地址 Hsin-Chu TW