发明名称 OPTICAL TESTING SYSTEM AND METHOD
摘要 An optical testing system includes: a testing probe, a collecting unit, and a processing unit, wherein the testing probe includes a plurality of spectrum photodiodes used for emitting and casting monochromatic light to a sample, wherein the wavelength of the light emitted by at least one spectrum photodiode is different from that of any other. The collecting unit collects multi-way signal light obtained after the emitted monochromatic light is reflected by the sample surface. The processing unit includes a photoelectric conversion module, an adding module and a testing module. The photoelectric conversion module converts the collected multi-way signal light respectively to multi-way electrical signals. The adding module performs an adding operation for the multi-way electrical signal to obtain an operation result. The testing module tests a quality parameter of the sample according to the operation result, and outputs a testing result.
申请公布号 US2016169793(A1) 申请公布日期 2016.06.16
申请号 US201514830365 申请日期 2015.08.19
申请人 China Agricultural University 发明人 PENG Yankun;ZHAO Juan
分类号 G01N21/27;G01N33/12 主分类号 G01N21/27
代理机构 代理人
主权项 1. An optical testing system, comprising: a testing probe, a collecting unit, and a processing unit, wherein said testing probe comprises a plurality of spectrum photodiodes, each of said spectrum photodiode is used for emitting monochromatic light, and casting said monochromatic light to a sample, wherein the wave length of the monochromatic light emitted by at least one spectrum photodiode is different from that of any other spectrum photodiode; said collecting unit is used for collecting multi-way signal light obtained after the monochromatic light emitted by said plurality of spectrum photodiodes is reflected by said sample surface; said processing unit comprises a photoelectric conversion module, an adding module and testing module, said photoelectric conversion module being used for converting the multi-way signal light collected by said collecting unit respectively to multi-way electrical signals; said adding module being used for performing an adding operation for said multi-way electrical signals to obtain an operation result; said testing module being used for testing a quality parameter of said sample according to said operation result, and outputting a testing result.
地址 Beijing CN