发明名称 |
Infrared detector with metal-black coating having dielectric overlayer and related methods |
摘要 |
An infrared (IR) detector may include a substrate, circuitry carried by the substrate, and a metal-black layer over the thermometric element. The circuitry may include a thermometric element with a measurable thermometric property. The IR detector may include a dielectric layer covering the metal-black layer, and the circuitry provides a value for IR radiation absorbed by the metal-black layer. |
申请公布号 |
US9518868(B2) |
申请公布日期 |
2016.12.13 |
申请号 |
US201414308879 |
申请日期 |
2014.06.19 |
申请人 |
UNIVERITY OF CENTRAL FLORIDA RESEACH FOUNDATION, INC. |
发明人 |
Panjwani Deep |
分类号 |
G01J5/08;G01J5/04 |
主分类号 |
G01J5/08 |
代理机构 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
代理人 |
Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A. |
主权项 |
1. An infrared (IR) detector comprising:
a substrate; circuitry carried by said substrate; said circuitry comprising a thermometric element with a measurable thermometric property; a gold-black layer over said thermometric element; and a dielectric layer covering said gold-black layer; said circuitry providing a value for IR radiation absorbed by said gold-black layer. |
地址 |
Orlando FL US |