发明名称 DEFECT DETECTING CIRCUIT AND CONTROLLER
摘要 PROBLEM TO BE SOLVED: To solve such a problem that circuit scale is enlarged or a defect is erroneously detected in a conventional defect detecting circuit. SOLUTION: The defect detecting circuit includes a detecting circuit 52 detecting quantity of change in an amplitude level of an input signal and outputting it as a tilt detecting signal, a comparing voltage control circuit 54 changing a level of comparing voltage Vcomp in accordance with an amplitude level of the input signal, and a comparing circuit 53 comparing a level of the tilt detecting signal with a level of the comparing voltage Vcomp and outputting a control signal. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008047164(A) 申请公布日期 2008.02.28
申请号 JP20060218771 申请日期 2006.08.10
申请人 NEC ELECTRONICS CORP 发明人 KAWAI KEIGO
分类号 G11B20/10;G11B7/004;G11B7/09;G11B19/28 主分类号 G11B20/10
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