发明名称 Method of increasing MEMS enclosure pressure using outgassing material
摘要 Semiconductor manufacturing processes include providing a first substrate having a first passivation layer disposed above a patterned top-level metal layer, and further having a second passivation layer disposed over the first passivation layer; the second passivation layer has a top surface. The processes further include forming an opening in a first portion of the second passivation layer, and the opening exposes a portion of a surface of the first passivation layer. The processes further include patterning the second and first passivation layers to expose portions of the patterned top-level metal layer and bonding a second substrate and the first substrate to each other. The bonding occurs within a temperature range in which at least the exposed portion of the first passivation layer undergoes outgassing.
申请公布号 US9452925(B2) 申请公布日期 2016.09.27
申请号 US201514832786 申请日期 2015.08.21
申请人 InvenSense, Inc. 发明人 Zhang Cerina;Lim Martin;Shin Jongwoo;Seeger Joseph
分类号 H01L23/02;H01L21/54;B81C1/00;B81B7/02 主分类号 H01L23/02
代理机构 Sterne, Kessler, Goldstein & Fox P.L.L.C. 代理人 Sterne, Kessler, Goldstein & Fox P.L.L.C.
主权项 1. A manufacturing method, comprising: providing a first substrate having a first passivation layer disposed above a patterned top-level metal layer, and further having a second passivation layer disposed over the first passivation layer, the second passivation layer having a top surface; forming an opening in a first portion of the second passivation layer, the opening exposing a portion of a surface of the first passivation layer; patterning the second and first passivation layers to expose portions of the patterned top-level metal layer; and bonding a second substrate and the first substrate to each other; wherein the bonding occurs within a temperature range in which at least the exposed portion of the first passivation layer undergoes outgassing.
地址 Sunnyvale CA US