AUTOMATIC TEST EQUIPMENT CAPABLE OF HIGH SPEED TEST

摘要

An automatic test apparatus for high speed test is provided to overcome a limit of an operational frequency of an FPGA by installing an acceleration circuit and a deceleration circuit at ends of the FPGA. An automatic test unit body tests a semiconductor element in an electrical method. An FPGA(190) controls a driver and a comparator which are installed in an automatic test unit. An acceleration circuit(400) is connected to an output terminal of the FPGA in order to double an operational frequency of the FPGA. A deceleration circuit(500) is connected to an output terminal of the FPGA in order to convert the operational frequency of the semiconductor element to an operational frequency of the FPGA.