发明名称 FOREIGN MATTER DETECTION METHOD
摘要 PROBLEM TO BE SOLVED: To accurately detect a foreign matter or a defective.SOLUTION: In the case that inspection is performed using two backgrounds of different system colors as two backgrounds of different optical characteristics, even a pixel obtained by imaging a foreign matter that is determined to be a pixel obtained by imaging a background material when one background is used is determined as a pixel obtained by imaging an inspection object when the other background is used. Therefore, regarding the pixel obtained by imaging the inspection object, whether the object is a nondefective or not can be certainly inspected. Therefore, a foreign matter or a defective can be more accurately detected than the conventional art.SELECTED DRAWING: Figure 3
申请公布号 JP2016090476(A) 申请公布日期 2016.05.23
申请号 JP20140227186 申请日期 2014.11.07
申请人 SUMITOMO ELECTRIC IND LTD 发明人 KIMURA AKINORI;ISHIKAWA HIROKI;SAITO TATSUHIKO;ITO MASUMI
分类号 G01N21/85;B07C5/342 主分类号 G01N21/85
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