发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to improve a step coverage by leaving a predetermined pattern even in a portion where a cell is not to be formed by using a dummy pattern. CONSTITUTION: After an interlayer dielectric is deposited on a semiconductor substrate having a semiconductor device, an insulating layer corresponding to a portion where a capacitor is to be formed, is etched. A conductive layer as a storage electrode(102) is deposited and a photoresist layer(103) is evaporated on the storage electrode. The conductive layer is etched by forming a pattern so that a part of the photoresist layer is left in a portion where a cell is not to be formed. An upper portion of the conductive layer is eliminated by a chemical mechanical polishing(CMP) method.
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申请公布号 |
KR20010008622(A) |
申请公布日期 |
2001.02.05 |
申请号 |
KR19990026542 |
申请日期 |
1999.07.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, CHI SEON;KOO, BON SEONG;LEE, JEONG HUN |
分类号 |
H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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