发明名称 |
Sulfonyl photoacid generators and photoresists comprising same |
摘要 |
New bis(sulfonyl)imide and tri(sulfonyl)methide photoacid generator compounds (“PAGs”) are provided as well as photoresist compositions that comprise such PAG compounds. |
申请公布号 |
US9488910(B2) |
申请公布日期 |
2016.11.08 |
申请号 |
US201012968130 |
申请日期 |
2010.12.14 |
申请人 |
Rohm and Haas Electronic Materials LLC |
发明人 |
Liu Cong;Xu Cheng-Bai |
分类号 |
G03F7/004;G03F7/30;C07C311/03;C07C311/48;C07C309/17;C07C381/12;G03F7/038;G03F7/039 |
主分类号 |
G03F7/004 |
代理机构 |
Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. |
代理人 |
Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F. |
主权项 |
1. A photoresist composition comprising a resin and a photoacid generator compound of the following Formula II: wherein W, Y are each independently hydrogen, fluorine, optionally substituted fluoroalkyl; optionally substituted fluoroalkoxy; or optionally substituted fluorocarbocyclic aryl; W′, Y′ are each independently the same as defined for W and Y; n and n′ are each the same or different and are each a positive integer; U and U′ are each the same or different and are each a linker; and R and R′ are each the same or different and are each an optionally substituted carboalicyclic, optionally substituted heteroalicyclic, optionally substituted carbocyclic aryl, or optionally substituted heteroaromatic group; X+ is a counter ion. |
地址 |
Malborough MA US |