发明名称 SYSTEM AND METHOD FOR CONTROLLING PROGRESS OF LOT IN SEMICONDUCTOR SUBSTRATE MANUFACTURING STEP
摘要 PROBLEM TO BE SOLVED: To solve such a problem that, in a conventional advance processing, wafers to be processed in advance are divided by lot into separate housing containers beforehand by a wafer transfer machine and processed by a processor, and after the remaining wafers are processed, the previously processed wafers are returned to the original housing containers, thereby causing loss due to the wafer transfer machine and gives an influence on the progress of lot. SOLUTION: Processing can be conducted through slot designation without dividing wafers to be processed in advance in a processor, and the wafers are divided only when regeneration is needed according to an inspection result after processing. As a result, an excessive wafer transfer step can be reduced, and the progress of lot can be smoothly advanced. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005235900(A) 申请公布日期 2005.09.02
申请号 JP20040041103 申请日期 2004.02.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 FUJIMOTO MANABU
分类号 H01L21/027;H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/027
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