| 发明名称 |
APPARATUS AND METHOD FOR CONDITION MONITORING OF MULTIPLE ELECTRICAL SUB-SYSTEMS |
| 摘要 |
Described is an apparatus which comprises: one or more sensors for coupling to a power source and for sensing electrical parameters of the power source, wherein the power source is operable to provide power to a system having one or more sub-systems; and a processor to analyze the sensed electrical parameters and to detect and identify one or more events associated with the system and the one or more sub-systems. |
| 申请公布号 |
US2016349293(A1) |
申请公布日期 |
2016.12.01 |
| 申请号 |
US201514724325 |
申请日期 |
2015.05.28 |
| 申请人 |
Intel Corporation |
发明人 |
Chattopadhyay Rita;Gurbacki Phillip M. |
| 分类号 |
G01R21/00;G01R19/00;F24F11/00 |
主分类号 |
G01R21/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus comprising:
one or more sensors for coupling to a power source and for sensing electrical parameters of the power source, wherein the power source is operable to provide power to a system having one or more sub-systems; and a processor to analyze the sensed electrical parameters and to detect and identify one or more events associated with the system and the one or more sub-systems. |
| 地址 |
Santa Clara CA US |
