| 摘要 |
PURPOSE:To enable structural analysis with accuracy of nm without excitation light by arranging a radioactive isotope generating an electromagnetic wave at an atomic position of a part to be analyzed to measure an intensity distribution of the electromagnetic wave generated from the isotope. CONSTITUTION:The inside of a long and narrow sample chamber 2 surrounded with an acrylic plate is replaced with He. A sample 4 has an LB film (e.g. arachidinic acid) laminated on a flat substrate and iron arachidinate with a mass number 55 of Fe (hereinafter called as Fe55), for instance, is laminated on a layer desired to measure a distance from the substrate. The sample 4 is covered with an acrylic plate 1 containing lead so as not to detect a signal noise from the perimeter thereof. Fe55 generates characteristic X rays by trapping orbit electrons of a radioactive isotope (He so arranged as not to absorb the characteristic X rays. Changes attributed to drawing angle distribution of the intensity of the characteristic X rays can be observed with an imaging plate 5 as cycle of interference fringe. This cycle allows the determination of a distance between the Fe55 and the substrate with accuracy of nm. |
