发明名称 Self-repairing memory and method of use
摘要 A self-repair unit includes a self-repair address comparator configured to receive address information from a control logic circuit, and to compare the received address with a faulty address in a memory array. The self-repair unit further includes a redundant engine configured to re-direct access to a redundancy address in a redundant memory if the received address matches the faulty address, wherein the redundancy address corresponds to the faulty address in the memory array. The self-repair unit further includes a cache stack counter configured to determine a number of pending repairs in a corrected data cache connected to the memory array and to the redundant memory.
申请公布号 US9396817(B2) 申请公布日期 2016.07.19
申请号 US201514700861 申请日期 2015.04.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 O'Connell Cormac Michael
分类号 G11C7/00;G11C29/44;G11C29/18;G11C29/38 主分类号 G11C7/00
代理机构 Hauptman Ham, LLP 代理人 Hauptman Ham, LLP
主权项 1. A self-repair unit comprising: a self-repair address comparator configured to receive address information from a control logic circuit, and to compare the received address with a faulty address in a memory array; a redundant engine configured to re-direct access to a redundancy address in a redundant memory if the received address matches the faulty address, wherein the redundancy address corresponds to the faulty address in the memory array; and a cache stack counter configured to determine a number of pending repairs in a corrected data cache connected to the memory array and to the redundant memory.
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