Method and a system for determining the place of origin of passive intermodulation products

摘要

A method for determining the place of origin of a passive intermodulation product excites a distributed device under test with two first excitation signals (x1(t), x2(t), each with a single spectral line, of which the frequencies (f1, f2) provide a frequency spacing relative to one another. Following this, the phase (φIM3Meas) of a first passive intermodulation product generated at the place of origin in the distributed device under test from the first excitation signals ((x1(t), x2(t)) by nonlinear distortion is measured, and the delay time of the first passive intermodulation product from the place of origin to the measuring device is calculated from the measured phase (x1(t), x2(t)) and the frequency (2·f1−f2) of the first passive intermodulation product. Finally, the place of origin of the passive intermodulation product is determined from the delay time and the topology of the distributed device under test.

主权项

1. A method for determining a place of origin of a passive intermodulation product by an analyzer, said method comprising:
exciting of a distributed device under test with two first excitation signals (x1(t), x2(t)) in a signal source of the analyzer, each with a single spectral line, of which frequencies (f1, f2) provide a frequency spacing relative to one another and of which phases are phase coherent to each other, measuring a phase of a first passive intermodulation product generated at the place of origin within the distributed device under test by nonlinear distortion from the first excitation signals (x1(t), x2(t)) in the analyzer, calculating delay time of the first passive intermodulation product from the place of origin to a measuring device from a measured phase and frequency (2·f1−f2) of the first passive intermodulation product in a calculation unit integrated in the analyzer, and determining the place of origin of the passive intermodulation product from the delay time and a topology of the distributed device under test in the calculation unit integrated in the analyser, wherein measuring the phase includes measuring φIM3Meas.