发明名称 Selection method of satellites for RTK positioning calculation and a selection device of satellites for the same
摘要 A selection method of satellites for RTK positioning calculation includes initializing a mask threshold of the elevation angle mask and/or the signal strength mask, setting the mask threshold as a first mask threshold other than a mask threshold which carried out an initial setting, performing a first RTK positioning calculation based on a signal from the satellite, performing a first quality check about a positioning solution in the first RTK positioning calculation, and when the first quality check is under the threshold of the ratio test, performing a second RTK positioning calculation based on the signal from the satellite newly chosen via the first mask threshold and performing a second quality check about a second positioning solution in the second RTK positioning calculation.
申请公布号 US9417327(B2) 申请公布日期 2016.08.16
申请号 US201213442486 申请日期 2012.04.09
申请人 ELECTRONIC NAVIGATION RESEARCH INSTITUTE, AN INDEPENDENT ADMINISTRATIVE INSTITUTION 发明人 Yamada Hideki
分类号 G01S19/22;G01S19/28;G01S19/43 主分类号 G01S19/22
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A selection method of satellites for RTK positioning calculation via an elevation angle mask, which chooses a satellite according to an elevation angle of the satellite, and/or a signal strength mask, which chooses a satellite with the signal strength of the satellite, the selection method comprising: receiving a signal from each of the satellites with an electronic device; initializing a mask threshold of said elevation angle mask and/or a mask threshold of said signal strength mask; setting a mask threshold of either said elevation angle mask or said signal strength mask as a first mask threshold other than a mask threshold which carried out an initial setting; performing a first RTK positioning calculation based on signals from four or more chosen satellites via said initialized mask threshold; performing a first quality check about a positioning solution in the first RTK positioning calculation of a device position, wherein when a solution of a ratio test by the first quality check is more than a threshold of the ratio test set up by a user, a first positioning solution in said first RTK positioning calculation is a high precision positioning solution, and wherein when a solution of the ratio test by said first quality check is under the threshold of the ratio test, the mask threshold for either the elevation or the signal strength mask is changed to the first mask threshold; performing a second RTK positioning calculation based on signals from four or more satellites newly chosen via said first mask threshold with the signals from the satellites chosen via said mask threshold which carried out initial setting; and performing a second quality check about a second positioning solution in the second RTK positioning calculation of the device position, wherein when a solution of the ratio test by the second quality check is more than the threshold of the ratio test, the second positioning solution in said second RTK positioning calculation is taken as a high precision positioning solution, when the decision result by said second quality check is less than the threshold of a ratio test, the positioning solution in said second RTK positioning calculation is made into a low accuracy positioning solution, and each of said positioning calculations and said quality checks is ended after performing the calculation and check no more than two times.
地址 Tokyo JP