发明名称 MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness
摘要 It is an object to provide an SOI device capable of carrying out body fixation and implementing a quick and stable operation. A gate insulating film ( 11 ) having a thickness of 1 to 5 nm is provided between a portion other than a gate contact pad (GP) of a gate electrode ( 12 ) and an SOI layer ( 3 ), and a gate insulating film ( 110 ) having a thickness of 5 to 15 nm is provided between the gate contact pad (GP) and the SOI layer ( 3 ). The gate insulating film ( 11 ) and the gate insulating film ( 110 ) are provided continuously.
申请公布号 US7300847(B2) 申请公布日期 2007.11.27
申请号 US20050317687 申请日期 2005.12.27
申请人 RENESAS TECHNOLOGY CORP. 发明人 MAEDA SHIGENOBU;MATSUMOTO TAKUJI;IWAMATSU TOSHIAKI;IPPOSHI TAKASHI
分类号 H01L21/336;H01L27/08;H01L21/8238;H01L21/84;H01L27/092;H01L27/12;H01L29/423;H01L29/786 主分类号 H01L21/336
代理机构 代理人
主权项
地址