发明名称 |
QUANTUM WELL STRUCTURE, SEMICONDUCTOR LASER, SPECTRAL MEASURING INSTRUMENT AND METHOD OF MANUFACTURING QUANTUM WELL STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a quantum well structure, semiconductor laser, spectral measuring instrument and method of manufacturing the quantum well structure in which performance of characteristics can be improved by accomplishing the quantum well structure in which a large crystal of In composition thicker than the prior art is made into quantum well layer. SOLUTION: In a quantum well structure 12 with a quantum well layer 10 formed on an InP substrate, the quantum well layer 10 is crystal-grown at a temperature of≥440°C and≤510°C and the quantum well layer 10 has compression distortion of≥2% and <10%. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008227329(A) |
申请公布日期 |
2008.09.25 |
申请号 |
JP20070066082 |
申请日期 |
2007.03.15 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
SATO TOMONARI;MITSUHARA MANABU;KONDO YASUHIRO |
分类号 |
H01S5/343 |
主分类号 |
H01S5/343 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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