发明名称 QUANTUM WELL STRUCTURE, SEMICONDUCTOR LASER, SPECTRAL MEASURING INSTRUMENT AND METHOD OF MANUFACTURING QUANTUM WELL STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a quantum well structure, semiconductor laser, spectral measuring instrument and method of manufacturing the quantum well structure in which performance of characteristics can be improved by accomplishing the quantum well structure in which a large crystal of In composition thicker than the prior art is made into quantum well layer. SOLUTION: In a quantum well structure 12 with a quantum well layer 10 formed on an InP substrate, the quantum well layer 10 is crystal-grown at a temperature of≥440°C and≤510°C and the quantum well layer 10 has compression distortion of≥2% and <10%. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008227329(A) 申请公布日期 2008.09.25
申请号 JP20070066082 申请日期 2007.03.15
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 SATO TOMONARI;MITSUHARA MANABU;KONDO YASUHIRO
分类号 H01S5/343 主分类号 H01S5/343
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