发明名称 |
Cu-Ga ALLOY SPUTTERING TARGET AND Cu-Ga ALLOY INGOT |
摘要 |
PROBLEM TO BE SOLVED: To provide a Cu-Ga alloy sputtering target capable of suppressing the occurrence of fine cracks on the sputtering target surface and the occurrence of abnormal discharge during sputtering and stably depositing a film, and a Cu-Ga alloy ingot excellent in cutting workability and capable of accurately forming the Cu-Ga alloy sputtering target.SOLUTION: A Cu-Ga alloy sputtering target formed by a melt casting method includes Ga within 21 at.% or more and 31 at.% or less and the remainder having a composition consisting of Cu and inevitable impurities and includes: a (ζ+γ) phase 11 having an eutectoid structure of a ζ phase consisting of Cu and Ga and a tabular or acicular γ phase consisting of Cu and Ga; and a γ single phase 12 having a crystallized γ phase. In the (ζ+γ) phase 11, an average interval D of adjacent γ phases satisfies D<5 μm.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016141876(A) |
申请公布日期 |
2016.08.08 |
申请号 |
JP20150020658 |
申请日期 |
2015.02.04 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
SONOHATA TAKASHI;YANO SHOICHIRO;SAKAMOTO TOSHIO;KATO SHINJI |
分类号 |
C23C14/34;B22D21/00;B22D25/06;C22C9/00 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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