发明名称 |
Semiconductor device |
摘要 |
A semiconductor device includes: a plurality of first field effect transistors (FETs) having a gate formed on a main surface of a semiconductor substrate, and a drain and a source formed in regions on both sides of the gate; a plurality of second FETs having a gate formed on the main surface of the semiconductor substrate, and a drain and a source formed in regions on both sides of the gate; and an electrically conductive layer that penetrates the main surface and a back surface of the semiconductor substrate in a region between the pair of FETs; wherein the first and second FETs that form the pair of FETs are disposed close to each other so that their drains are opposite to each other; wherein region widths of the first and second FETs in a direction of shorter sides of sources thereof are substantially identical with region widths of the first and second FETs in a direction of shorter sides of drains thereof; wherein all the drains of the first and second FETs are electrically connected to each other; wherein all the gates of the first and second FETs are electrically connected to each other; and wherein all the sources of the first and second FETs are electrically connected to each other on the back surface of the semiconductor substrate through the conductive layer.
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申请公布号 |
US5852318(A) |
申请公布日期 |
1998.12.22 |
申请号 |
US19980025998 |
申请日期 |
1998.02.19 |
申请人 |
NEC CORPORATION |
发明人 |
CHIKAMATSU, KIYOSHI;WATANABE, TOSHIRO;INOUE, TOSHIAKI;KOSE, YASUSHI |
分类号 |
H01L29/78;H01L29/417;H01L29/423;H01L29/80;(IPC1-7):H01L29/76;H01L23/62 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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