发明名称 Lithography masks
摘要 In one embodiment, a mask for use in semiconductor processing comprises a first region formed from a first material that is primarily opaque, a second region formed from a second material that is primarily transmissive, and a third region in which at least a portion of the second material is removed to generate a phase shift in radiation applied to the mask.
申请公布号 US2008318137(A1) 申请公布日期 2008.12.25
申请号 US20070820420 申请日期 2007.06.19
申请人 SCHENKER RICHARD;SIVAKUMAR SWAMINATHAN;NYHUS PAUL;HENRICHS SVEN 发明人 SCHENKER RICHARD;SIVAKUMAR SWAMINATHAN;NYHUS PAUL;HENRICHS SVEN
分类号 G03F1/00 主分类号 G03F1/00
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