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发明名称
The manner of measurement of surface resistance of over-coupling layers in optoelectronic semi-conductive structures with p-n joint
摘要
申请公布号
PL383940(A1)
申请公布日期
2009.06.08
申请号
PL20070383940
申请日期
2007.12.03
申请人
INSTYTUT TECHNOLOGII ELEKTRONOWEJ
发明人
CZERWI&NACUTE,SKI ANDRZEJ;P&LSTROK,USKA MARIUSZ;RATAJCZAK JACEK;K&AOGON,TCKI JERZY
分类号
G01R31/00;G01N27/00
主分类号
G01R31/00
代理机构
代理人
主权项
地址
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