发明名称 SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To efficiently and analyze defects caused by a leakage-cut function, in a short time. SOLUTION: A plurality of switching circuits are provided, in correspondence with a plurality of circuit blocks. Each of plurality of the switching circuits is connected between a power supply terminal and a power supply line of a corresponding circuit block. A setting circuit is provided for setting the validity/invalidity, with respect to each of plurality of the switching circuits. A switching control circuit turns each of plurality of the switching circuits to ON, in response to a first control signal that indicates the operating states of plurality of the circuit blocks, when each circuit is set effective by the setting circuit; and turns each of the circuits to ON, independently of the first control signal, when each circuit is set ineffective by the setting circuit. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007218762(A) 申请公布日期 2007.08.30
申请号 JP20060040379 申请日期 2006.02.17
申请人 FUJITSU LTD 发明人 FUJIEDA WAICHIRO
分类号 G01R31/28;G01R31/3185;H01L21/822;H01L27/04 主分类号 G01R31/28
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