发明名称 APPARATUS AND METHOD FOR TESTING POWER SUPPLY VARIATION OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND PROGRAM THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a high-speed and highly accurate power supply voltage variation testing apparatus, a method, and a computer program. SOLUTION: A determination part 1-5 determines the level of a power supply voltage variation found out by a power supply voltage variation analysis part 1-2 to execute an optimum delay analysis based on a determination result. When the power supply voltage variation is small, a delay analysis based on the detailed power supply variation analysis can be omitted only by adding a fixed margin. Further, a method for performing a highly accurate power supply voltage variation test by using a power supply current expressed as a function of a time is also disclosed. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009003669(A) 申请公布日期 2009.01.08
申请号 JP20070163332 申请日期 2007.06.21
申请人 NEC ELECTRONICS CORP 发明人 NAKAJIMA HIDENARI
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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