发明名称 |
Phase change memory, writing method thereof and reading method thereof |
摘要 |
A phase change memory (PCM), a writing method thereof and a reading method thereof are provided. The PCM has a plurality of memory cells. The writing method comprises the following steps. At least one stress pulse is applied for aging at least one of the memory cells. A starting pulse is applied to all of the memory cells of the PCM for decreasing a resistance of each memory cell. A detection pulse is applied to all of the memory cells of the PCM for detecting the resistance of each memory cell. A set pulse is applied to the aged memory cells. A reset pulse is applied to the non-aged memory cells. |
申请公布号 |
US9396793(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201414276011 |
申请日期 |
2014.05.13 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Wu Chao-I;Lee Ming-Hsiu |
分类号 |
G11C11/00;G11C13/00 |
主分类号 |
G11C11/00 |
代理机构 |
McClure, Qualey & Rodack, LLP |
代理人 |
McClure, Qualey & Rodack, LLP |
主权项 |
1. A writing method of a phase change memory (PCM), wherein the PCM has a plurality of memory cells, and the writing method comprises:
applying at least one stress pulse for aging at least one of the memory cells; applying a starting pulse to all of the memory cells of the PCM for decreasing a resistance of each memory cell; applying a detection pulse to all of the memory cells of the PCM for detecting the aged memory cells and the non-aged memory cells; applying a set pulse to the aged memory cells; and applying a reset pulse to the non-aged memory cells; wherein the starting pulse is different from the set pulse. |
地址 |
Hsinchu TW |