发明名称 METHOD FOR EXPOSING A ELECTRON BEAM AND SUBSTRATE MANUFACTURING METHOD INCLUDING THE SAME
摘要 The present invention relates to a method for exposing an electron beam and to a substrate manufacturing method including the same. The method for exposing an electron beam includes the following steps of: designing a target pattern to be formed on a substrate; deriving a first dose map having first dose values of the beams to be provided to a photoresist formed on the substrate; and deriving a second dose map having second dose values which increase and decrease more than the first dose values by overlapping of the beams.
申请公布号 KR20160095284(A) 申请公布日期 2016.08.11
申请号 KR20150016178 申请日期 2015.02.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SOOK HYUN;TAMAMUSHI SHUICHI;SHIN, SO EUN;SHIN, IN KYUN;CHOI, JIN
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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