发明名称 SEMICONDUCTOR MEMORY AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory and a method of manufacturing the semiconductor memory which reduces a write/erase operating voltage for stack type memory cells to obtain a highly integrated memory cell structure and the reduction of power consumption. SOLUTION: The memory has a plurality of memory cell transistors each comprising a gate insulation film 2 electrically conducting owing to a tunnel effect, a floating gate electrode 21 on the gate insulation film 2, an inter-electrode insulation film 11 formed on the floating gate electrode 21 having a positive charge layer at the layer side of the lower half of a film thickness, and a control gate electrode 24 on the insulation film 11. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005235987(A) 申请公布日期 2005.09.02
申请号 JP20040042622 申请日期 2004.02.19
申请人 TOSHIBA CORP 发明人 OZAWA YOSHIO
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;H01L29/94;(IPC1-7):H01L21/824 主分类号 G11C16/04
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