发明名称 Photomask blank and photomask
摘要 A photomask blank comprising a transparent substrate on which are formed at least one light-shielding film and at least one antireflective film minimizes film stress and eliminates substrate warp following deposition of the light-shielding film and the antireflective film, when each film is composed of a CrCO layer, a CrCON layer, or a combination of CrCO and CrCON layers. The photomask blank can be accurately patterned without distortion to give a photomask.
申请公布号 US2001044054(A1) 申请公布日期 2001.11.22
申请号 US20010840097 申请日期 2001.04.24
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 KANEKO HIDEO;INAZUKI YUKIO;OKAZAKI SATOSHI
分类号 C23C14/06;G02B1/11;G03F1/08;G03F1/14;G03F1/46;G03F1/50;G03F1/54;H01L21/027;(IPC1-7):B32B15/00;B32B17/06;G03F9/00 主分类号 C23C14/06
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