发明名称 |
APPARATUS AND METHOD FOR VISUAL INSPECTION |
摘要 |
PURPOSE: An apparatus and a method for visual inspection are provided to indicate a test pattern on a test target panel by overlapping marker pattern on the test pattern. CONSTITUTION: A computer(12) directs the inspection of the test panel(11). A test pattern memorizing unit(13) memorizes the test pattern. Based on the automatic test result information, a marker pattern device(16) writes the marker pattern about the test panel. A pattern synthesizer(17) synthesizes the marker pattern and test pattern. The test pattern overlapped with the marker pattern is indicated on the test panel. |
申请公布号 |
KR20100124653(A) |
申请公布日期 |
2010.11.29 |
申请号 |
KR20100018335 |
申请日期 |
2010.03.02 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
MIZUNO KUNIHIRO;SUZUKI KOUJI |
分类号 |
G02F1/13;G01M11/00;G01N21/88;G09F9/00 |
主分类号 |
G02F1/13 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|