发明名称 APPARATUS AND METHOD FOR VISUAL INSPECTION
摘要 PURPOSE: An apparatus and a method for visual inspection are provided to indicate a test pattern on a test target panel by overlapping marker pattern on the test pattern. CONSTITUTION: A computer(12) directs the inspection of the test panel(11). A test pattern memorizing unit(13) memorizes the test pattern. Based on the automatic test result information, a marker pattern device(16) writes the marker pattern about the test panel. A pattern synthesizer(17) synthesizes the marker pattern and test pattern. The test pattern overlapped with the marker pattern is indicated on the test panel.
申请公布号 KR20100124653(A) 申请公布日期 2010.11.29
申请号 KR20100018335 申请日期 2010.03.02
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 MIZUNO KUNIHIRO;SUZUKI KOUJI
分类号 G02F1/13;G01M11/00;G01N21/88;G09F9/00 主分类号 G02F1/13
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