发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide an oxide proton-conductive film having little faults such as pinholes, a high reliability and a high proton conductivity, to provide a hydrogen permeation structure using the oxide proton-conductive film, and to provide a manufacturing method of the hydrogen permeation structure. <P>SOLUTION: The oxide proton-conductive film is composed of a perovskite structure oxide represented by the general formula A<SB>a</SB>L<SB>b(1-x)</SB>M<SB>bx</SB>O<SB>3</SB>(A represents an element selected from Ba, Mg, Ca and Sr; L represents an element selected from Ce, Zr, Ti and Hf; M represents an element selected from elements of group 3 and group 13; and 0.5<a<2.0 and 0.5<a/b<2.0), and has a thickness of &ge;20 nm and &le;500 nm, and an electric resistance in the air of &ge;100 k&Omega;. The hydrogen permeation structure is obtained by forming the oxide proton-conductive film on a hydrogen permeation substrate. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP4634252(B2) 申请公布日期 2011.02.23
申请号 JP20050231125 申请日期 2005.08.09
申请人 发明人
分类号 H01B1/08;C01B3/56;C01F17/00;C01G23/00;C01G25/00;C01G27/00;C23C16/40;G01N27/406;H01B1/06;H01M8/02;H01M8/12 主分类号 H01B1/08
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