Built-in self-test circuit and semiconductor device including the same

摘要

A built-in self-test circuit includes a command storage unit that stores commands inputted from an external device, an input/output control unit that controls the command storage unit to sequentially store the commands and sequentially output stored commands as internal commands in a test operation, and a command decoder unit that decodes the internal commands outputted from the command storage unit and outputs a test command.

主权项

1. A built-in self-test circuit comprising:
a command storage unit suitable for storing commands inputted from an external device; an input/output control unit suitable for controlling the command storage unit to sequentially store the commands and sequentially output stored commands as internal commands in a test operation; and a command decoder unit suitable for decoding the internal commands outputted from the command storage unit and outputting a test command, wherein the commands include a command signal including CS, RAS, CAS, WE, and CKE.