发明名称 METHOD OF ETCH PROXIMITY CORRECTION, METHOD OF CREATING PHOTOMASK LAYOUT USING THE SAME, COMPUTER READABLE MEDIA INCLUDING A SEQUENCE OF PROGRAMMED INSTRUCTIONS STORED THEREON FOR IMPLEMENTING THE SAME AND MASK IMAGING SYSTEM
摘要 <p>A method of performing etch proximity correction, taking into account an orientation-dependent component, includes providing a layout, selecting a target point on an edge of the layout, defining a proximity range from the target point, defining a probability function including a distance-dependent component, an orientation-dependent component, or both a distance-dependent component and an orientation-dependent component with respect to the proximity range, and calculating a surface integral of the probability function over the proximity range.</p>
申请公布号 KR20110102688(A) 申请公布日期 2011.09.19
申请号 KR20100021837 申请日期 2010.03.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIM, SEONG BO;KIM, SANG WOOK;SUH, CHUN SUK;CHOI, SEONG WOON;LEE, SUNG WOO
分类号 H01L21/027 主分类号 H01L21/027
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