| 摘要 |
In a calculator 520, a test bench 521 for event-driven asynchronous simulation described in an HDL is stored. An input-related description portion in the test bench 521 is input to an LSI tester 510 and converted into a signal input to a DUT 500, and then the signal input is applied to the DUT 500. Thereafter, an output signal produced from the DUT in response to the signal input is input to the LSI tester 510 and compared with an output signal obtained from a voltage condition table and the like, thereby determining the level of the output signal. This comparison result is input to the calculator 520, in which the comparison result is compared with an expected value and output waveform data described in the HDL test bench 521, so as to make a pass/failure determination for the DUT 500. It is thus possible to test the LSI (DUT) under the same conditions as the LSI is actually used in a product.
|
