发明名称 散乱光計測装置
摘要 Included are: an optical measurement apparatus (1) including a light source (10) that emits light including at least light of measurement target wavelength, an optical detector (12) that detects, via a branching unit, light received by a scattered light measurement probe (101), a branching unit (11) that guides the light from the light source (10) to the scattered light measurement probe (101) and guides the light from the scattered light measurement probe (101) to the optical detector (12), and a control unit (13) that evaluates scattering characteristics of a surface layer of an object to be examined based on the light detected by the optical detector (12), and the scattered light measurement probe (101) including a fiber (102) that connects to the optical measurement apparatus (1) at one end thereof, propagates the light from the light source to irradiate the object to be examined, comes in contact with the object to be examined at another end thereof, receives light that has irradiated the object to be examined, propagated inside the object to be examined, and returned thereto, and guides the light to the optical detector (12) as an optical signal, the fiber (102) including a core (1020) that propagates light and has an approximately-rod-shaped core having a diameter determined according to the scattering characteristics of the object to be examined.
申请公布号 JP5959652(B2) 申请公布日期 2016.08.02
申请号 JP20140535539 申请日期 2013.09.09
申请人 オリンパス株式会社 发明人 伊藤 遼佑
分类号 A61B1/00;G01N21/17 主分类号 A61B1/00
代理机构 代理人
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