| 摘要 |
The invention relates to an x-ray inspection system comprising an x-ray source (1), a detector (3) and a rotary table (4), which is arranged therebetween and at which a test object (2) can be secured, wherein the rotary table (4) is arranged on a positioning table (6), wherein the positioning table (6) is movable between the x-ray source (1) and the detector (3) parallel to the XY-plane, wherein the XY-plane is perpendicular to the surface of the detector (3) extending parallel to the XZ-plane and wherein the rotary table (4) is rotatable about the Z-axis. Moreover, the invention relates to methods for rotating a test object (2) in an x-ray inspection system according to one of the preceding patent claims, wherein the test object (2) is secured to the rotary table (4), wherein the rotary table (4) is rotated about the Z-axis and, simultaneously, the positioning table (6) is displaced in the XY-plane, wherein the rotational angle φ of the rotary table (4) has the following relationships to the X- and Y-positions of the positioning table (6): X = R x cos (φ - φ0) + X0 and Y = R x sin (φ - φ0) + Y0. |
