发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 There is provided a semiconductor device, comprising a substrate (101) that includes an integrated circuit region (1), first and second interlayer insulation films (108, 111, 112) formed above the substrate, and a reinforcing structure comprising a main-wall part (2) and a sub-wall part (3) which are formed in the first and second interlayer insulation films, wherein the main-wall part surrounds the integrated circuit region in a periphery thereof and the sub-wall part is provided apart from the main-wall part in a corner region of the semiconductor device and is located between the integrated circuit region and the first bend section of the main-wall part. Both the main-wall part and the sub-wall part are formed by metal-filled trenches (131, 132) in the first and second interlayer insulation films.
申请公布号 EP3073526(A1) 申请公布日期 2016.09.28
申请号 EP20160168580 申请日期 2003.02.14
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 WATANABE, KENICHI;KAWANO, MICHIARI;NAMBA, HIROSHI;SUKEGAWA, KAZUO;HASEGAWA, TAKUMI;SAWADA, TOYOJI;MITANI, JUNICHI
分类号 H01L23/58;G03F1/32;G03F1/68;H01L21/027;H01L21/3205;H01L21/66;H01L21/768;H01L21/822;H01L23/00;H01L23/52;H01L23/522;H01L27/04 主分类号 H01L23/58
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