Insertion of Faults into Computer Systems

摘要

Methods and apparatus are provided for causing the incorrect operation (‘faults’) of digital devices such as embedded computer systems or integrated circuits. The apparatus uses a switching element to cause perturbations on the power supplies of the digital device. This apparatus can be connected to existing embedded systems with a minimal of modifications, and can insert a variety of faults into those embedded systems. Such faults can be used for verification of fault-tolerant systems or algorithms, including both safety-critical designs and cryptographic designs.

主权项

1. An apparatus for causing fault(s) in the internal state of a device under test (‘DUT’), wherein the DUT is an embedded system or integrated circuit, the apparatus comprising:
a switching element which is configured to short the power supply of the DUT, such that the switching element causes a perturbation in a power supply for the DUT; and a pulse generator configured to generate short pulses lasting less than one millisecond, the output of said pulse generator configured to operate the switching element; and a control system configured to control the pulse width for said pulse generator, along with temporal location of the pulse.