发明名称 |
METHODS FOR DETERMINING A SHAPE OF A SUBSTANTIALLY CYLINDRICAL SPECULAR REFLECTIVE SURFACE |
摘要 |
A method for determining a shape of a substantially cylindrical specular reflective surface includes the step of obtaining calibration data and the step of obtaining target data about a target structure. The method further includes the step of defining a target line from the target data, where the target line represents a feature of the target structure and the step of capturing a reflected image of the target structure in the specular reflective surface. The method further includes the step of obtaining reflected data from the reflected image and the step of defining a reflected line from the reflected data, where the reflected line represents a reflection of the feature of the target structure. The method also includes the step of determining a correspondence between the target line and the reflected line and using the correspondence and the calibration data to determine the shape of the specular reflective surface. |
申请公布号 |
US2016290791(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201415037178 |
申请日期 |
2014.11.13 |
申请人 |
CORNING INCORPORATED |
发明人 |
Buono Joseph Richard;Potapenko Sergey Y.;Susch Nicholas Leon;Webb Dale Alan |
分类号 |
G01B11/24;G06K9/46 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
1. A method for determining a shape of a substantially cylindrical specular reflective surface comprising the steps of:
(I) obtaining calibration data; (II) obtaining target data about a target structure; (III) defining a target line from the target data, wherein the target line represents a feature of the target structure; (IV) capturing a reflected image of the target structure in the specular reflective surface; (V) obtaining reflected data from the reflected image; (VI) defining a reflected line from the reflected data, wherein the reflected line represents a reflection of the feature of the target structure; (VII) determining a correspondence between the target line and the reflected line; and (VIII) using the correspondence and the calibration data to determine the shape of the specular reflective surface. |
地址 |
Corning NY US |