发明名称 |
METHOD OF FORMING FIELD EFFECT TRANSISTORS (FETS) WITH ABRUPT JUNCTIONS AND INTEGRATED CIRCUIT CHIPS WITH THE FETS |
摘要 |
A method of forming field effect transistors (FETs) and on Integrated Circuit (IC) chips with the FETs. Channel placeholders at FET locations are undercut at each end of FET channels. Source/drain regions adjacent to each channel placeholder extend into and fill the undercut. The channel placeholder is opened to expose channel surface under each channel placeholder. Source/drain extensions are formed under each channel placeholder, adjacent to each source/drain region. After removing the channel placeholders metal gates are formed over each said FET channel. |
申请公布号 |
US2016380074(A1) |
申请公布日期 |
2016.12.29 |
申请号 |
US201514750120 |
申请日期 |
2015.06.25 |
申请人 |
International Business Machines Corporation |
发明人 |
Cheng Kangguo;Hashemi Pouya;Khakifirooz Ali;Reznicek Alexander |
分类号 |
H01L29/66;H01L29/06;H01L21/283;H01L21/321;H01L21/3213;H01L29/49;H01L27/088;H01L21/225 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming field effect transistors (FETs), said method comprising:
forming channel placeholders on a semiconductor surface; undercutting each channel placeholder at each end of a respective FET channel; forming a source/drain region adjacent to said each channel placeholder at said each end, each said source/drain region extending into and filling the undercut; exposing said semiconductor surface under said channel placeholders through said each channel placeholder, the surface being exposed to said each source/drain region; forming source/drain extensions on the exposed said semiconductor surface under said each channel placeholder to said each source/drain region; removing said channel placeholders; and forming a metal gate over each said FET channel. |
地址 |
Armonk NY US |