发明名称 METHOD OF FORMING FIELD EFFECT TRANSISTORS (FETS) WITH ABRUPT JUNCTIONS AND INTEGRATED CIRCUIT CHIPS WITH THE FETS
摘要 A method of forming field effect transistors (FETs) and on Integrated Circuit (IC) chips with the FETs. Channel placeholders at FET locations are undercut at each end of FET channels. Source/drain regions adjacent to each channel placeholder extend into and fill the undercut. The channel placeholder is opened to expose channel surface under each channel placeholder. Source/drain extensions are formed under each channel placeholder, adjacent to each source/drain region. After removing the channel placeholders metal gates are formed over each said FET channel.
申请公布号 US2016380074(A1) 申请公布日期 2016.12.29
申请号 US201514750120 申请日期 2015.06.25
申请人 International Business Machines Corporation 发明人 Cheng Kangguo;Hashemi Pouya;Khakifirooz Ali;Reznicek Alexander
分类号 H01L29/66;H01L29/06;H01L21/283;H01L21/321;H01L21/3213;H01L29/49;H01L27/088;H01L21/225 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of forming field effect transistors (FETs), said method comprising: forming channel placeholders on a semiconductor surface; undercutting each channel placeholder at each end of a respective FET channel; forming a source/drain region adjacent to said each channel placeholder at said each end, each said source/drain region extending into and filling the undercut; exposing said semiconductor surface under said channel placeholders through said each channel placeholder, the surface being exposed to said each source/drain region; forming source/drain extensions on the exposed said semiconductor surface under said each channel placeholder to said each source/drain region; removing said channel placeholders; and forming a metal gate over each said FET channel.
地址 Armonk NY US
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