HANDLER FOR TESTING SEMICONDUCTOR DEVICES AND METHOD FOR CONTROLLING THE SAME

摘要

A handler for testing semiconductor devices and a method for controlling the same are provided to improve space utility by loading and unloading a semiconductor in a horizontal direction and testing the semiconductor in a vertical direction. A loading unit(30) loads semiconductor devices to be tested on a test tray. A first chamber heats or cools the semiconductor devices of the test tray to a given test temperature. A first rotator(52) rotates the test tray in the first chamber at a right angle. A test unit has a test head(62) which is electrically connected to the semiconductor devices. A second chamber cools or heats the semiconductor devices carried from the test unit. A second rotator(72) rotates the test tray in the second chamber at a right angle. An unloading unit(40) unloads the semiconductor devices from the test tray.