Method and apparatus for high sensitivity particulate detection in infrared detector assemblies

摘要

A detector assembly includes a dewar chamber having an aperture and an infrared radiation detector. The detector assembly also includes a mirror disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface and an emitting region facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact caused by a particle in the dewar chamber that blocks a portion of the first or second radiation.

主权项

1. A detector assembly comprising:
a dewar chamber comprising an aperture and an infrared radiation detector; and a mirror disposed adjacent the aperture of the dewar chamber, the mirror having a reflective surface and an emitting region facing the aperture; wherein the infrared radiation detector is configured to detect first radiation and second radiation from the mirror, the first radiation originating from at least one relatively cold surface in the dewar chamber and reflecting off the reflective surface of the mirror, the second radiation originating from at least one relatively warm surface at or behind the emitting region, and wherein the infrared radiation detector is configured to detect an artifact caused by a particle in the dewar chamber that blocks a portion of the first or second radiation.