发明名称 Polisher for chemical mechanical planarization
摘要 Embodiments of a polisher for chemical mechanical planarization. The polisher includes a polishing pad structure containing a first reactant therein, and a second reactant in a polishing environment over the polishing pad structure. The first reactant and the second reactant react endothermically upon contact when polishing a wafer surface between the polishing pad structure and the polishing environment.
申请公布号 US2008233839(A1) 申请公布日期 2008.09.25
申请号 US20070727119 申请日期 2007.03.23
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LU HSIN-HSIEN;CHEN LIANG-GUANG;BAO TIEN-I;SHUE SHAU-LIN
分类号 C25F3/30 主分类号 C25F3/30
代理机构 代理人
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