发明名称 Chip-on-Wafer structures and methods for forming the same
摘要 A package component includes a substrate, wherein the substrate has a front surface and a back surface over the front surface. A through-via penetrates through the substrate. A conductive feature is disposed over the back surface of the substrate and electrically coupled to the through-via. A first dielectric pattern forms a ring covering edge portions of the conductive feature. An Under-Bump-Metallurgy (UBM) is disposed over and in contact with a center portion of the conductive feature. A polymer contacts a sidewall of the substrate. A second dielectric pattern is disposed over and aligned to the polymer. The first and the second dielectric patterns are formed of a same dielectric material, and are disposed at substantially a same level.
申请公布号 US8643148(B2) 申请公布日期 2014.02.04
申请号 US201213397204 申请日期 2012.02.15
申请人 LIN JING-CHENG;CHANG HSIN;LIN SHIH TING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN JING-CHENG;CHANG HSIN;LIN SHIH TING
分类号 H01L21/78 主分类号 H01L21/78
代理机构 代理人
主权项
地址
您可能感兴趣的专利