| 摘要 |
PROBLEM TO BE SOLVED: To provide a deformation amount measuring structure capable of repeatedly and accurately measuring deformation amounts of a measuring object when the same is extended or bent without interfering movement of the measuring object.SOLUTION: A deformation amount measuring structure comprises a base material 10 subject to extensional deformation or bending deformation and a sensor element 11. The sensor element 11: has a dielectric layer 12 which is arranged on a surface of the base material 10 and includes elastomer, a pair of electrode layers 13a and 13b which are arranged with the dielectric layer 12 placed in between and include the elastomer and an electrical conducting material, and a protection layer 14a or 14b which is arranged on a surface of at least one of the pair of electrode layers 13a and 13b and includes the elastomer; and extends or contracts according to deformation of the base material 10. In the deformation amount measuring structure, permanent tensile deformation of at least either the dielectric layer 12 or the protection layer 14a or 14b is not more than 10%; and a tensile or bending deformation amount of the base material 10 is measured on the basis of a change in capacitance output by the sensor element 11.SELECTED DRAWING: Figure 2 |
