发明名称 ABNORMALITY DETECTING DEVICE
摘要 A microprocessor (MPU) serving as an abnormality detecting device carries out a drive circuit operating state assessment (step 202). If the drive circuit is in a non-driving state (step 202: NO), the MPU stores in a storage domain a board temperature detected value Tc, detected for each predetermined calculation period, as a board temperature reference value Tr (Tr=Tc, step 203). If the drive circuit is in a driving state (step 202: YES), the MPU reads the reference value Tr stored in the storage domain (step 204), and calculates a difference value ΔT between the reference value Tr and the detected value Tc detected for each predetermined calculation period (ΔT=Tc-Tr, step 205). Then, if the absolute value of the difference value ΔT is equal to or less than a predetermined threshold α (|ΔT| ≤ α, step 206: YES), the MPU assesses that a sticking abnormality of the output signal from the temperature sensor has occurred.
申请公布号 WO2016148034(A1) 申请公布日期 2016.09.22
申请号 WO2016JP57672 申请日期 2016.03.10
申请人 AISIN SEIKI KABUSHIKI KAISHA 发明人 NAKAMURA, Manabu
分类号 G01K7/24 主分类号 G01K7/24
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