发明名称 Test board and test system
摘要 A test board includes a socket, a mounting test circuit, and a relay. An analog core embedded application processor is installed into the socket. The mounting test circuit has a same configuration as an environment where the analog core embedded application processor is actually used. The relay disconnects the mounting test circuit from the socket in response to a first control signal when a vector test is performed on the analog core embedded application processor, and that connects the mounting test circuit to the socket in response to a second control signal when a mounting set test is performed on the analog core embedded application processor.
申请公布号 US2009076747(A1) 申请公布日期 2009.03.19
申请号 US20080283872 申请日期 2008.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE NAM-JOONG;KANG WEON-TARK
分类号 G01R31/26;G06F19/00 主分类号 G01R31/26
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