发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD OF ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of reducing a thermal load to a substrate and heat-treating the large-area substrate, and to provide a manufacturing method of a semiconductor device capable of reducing a contaminant and improving the characteristics of the semiconductor device. SOLUTION: A semiconductor film 102 is formed on the substrate 100, a first film 103 is formed on the semiconductor film, and then the semiconductor film is scanned with the flame of a gas burner 22 using mixed gas of hydrogen and oxygen as fuel via the first film, thus recrystallizing the semiconductor film. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008098377(A) 申请公布日期 2008.04.24
申请号 JP20060277962 申请日期 2006.10.11
申请人 SEIKO EPSON CORP 发明人 SATO MITSURU;UTSUNOMIYA SUMIO
分类号 H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/20
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